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国家自然科学基金(60736032)

作品数:4 被引量:14H指数:2
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Research progress in ZnO single-crystal:growth, scientific understanding, and device applications被引量:11
2014年
Zinc oxide,a wide band-gap semiconductor,has shown extensive potential applications in high-efficiency semiconductor photoelectronic devices,semiconductor photocatalysis,and diluted magnetic semiconductors.Due to the undisputed lattice integrity,ZnO single crystals are essential for the fabrication of high-quality ZnO-based photoelectronic devices,and also believed to be ideal research subjects for understanding the underlying mechanisms of semiconductor photocatalysis and diluted magnetic semiconductors.This review,which is organized in two main parts,introduces the recent progress in growth,basic characterization,and device development of ZnO single crystals,and some related works in our group.The first part begins from the growth of ZnO single crystal,and summarizes the fundamental and applied investigations based on ZnO single crystals.These works are composed of the fabrication of homoepitaxial ZnO-based photoelectronic devices,the research on the photocatalysis mechanism,and dilute magnetic mechanism.The second part describes the fabrication of highly thermostable n-type ZnO with high mobility and high electron concentration through intentional doping.More importantly,in this part,a conceptual approach for fabricating highly thermostable p-type ZnO materials with high mobility through an integrated three-step treatment is proposed on the basis of the preliminary research.
Feng HuangZhang LinWenwen LinJiye ZhangKai DingYonghao WangQinghong ZhengZhibing ZhanFengbo YanDagui ChenPeiwen LvXian Wang
关键词:半导体光电器件ZNO单晶宽带隙半导体
Characterization of Phosphorus Diffused ZnO Bulk Single Crystals
2008年
Phosphorus was diffused into CVT grown undoped ZnO bulk single crystals at 550 and 800℃ in a closed quartz tube. The P-diffused ZnO single crystals were characterized by the Hall effect, X-ray photoelectron spectroscopy (XPS), photoluminescence spectroscopy (PL), and Raman scattering. The P-diffused ZnO single crystals are n-type and have higher free electron concentration than undoped ZnO, especially for the sample diffused at 800℃. The PL measurement reveals defect related visible broad emissions in the range of 420-550nm in the P-diffused ZnO samples. The XPS result suggests that most of the P atoms substitute in the Zn site after they diffuse into the ZnO single crystal at 550℃ ,while the P atom seems to occupy the O site in the ZnO samples diffused at 800℃. A high concentration of shallow donor defect forms in the P-diffused ZnO,resulting in an apparent increase of free electron concentration.
张瑞张璠赵有文董志远杨俊
关键词:DIFFUSIONDEFECTZNOPHOSPHORUS
掺Sb的ZnO单晶的缺陷和性质研究被引量:2
2008年
采用化学气相传输法生长了掺Sb的ZnO体单晶,生长温度为950℃.与非掺ZnO单晶相比,掺Sb后ZnO单晶仍为n型,其自由电子浓度明显升高.X射线光电子能谱(XPS)测量结果表明,掺入的Sb在ZnO单晶中可能占据了Zn位,或处于间隙位置,形成了施主.利用光致发光谱(PL)测量发现掺Sb后ZnO单晶发出蓝光,该蓝色荧光与浅施主有关.这些结果表明在高温生长条件下,掺Sb后ZnO单晶中产生了高浓度的施主缺陷,因而难以获得p型材料.
张瑞张璠赵有文董志远杨俊
关键词:ZNO单晶掺杂
铟掺杂ZnO体单晶的生长及其性质被引量:1
2008年
研究了In掺杂n型ZnO体单晶的化学气相传输法生长和材料性质.利用霍尔效应、X射线光电子能谱、光吸收谱、喇曼散射、阴极荧光谱等手段对晶体的特性和缺陷进行了分析.掺In后容易获得浓度为1018~1019cm-3的n型ZnO单晶,掺入杂质的激活效率很高.随着掺杂浓度的提高,ZnO单晶的带边吸收和电学性质等发生明显的变化.分析了掺In-ZnO单晶的缺陷及其对材料性质的影响.
张璠赵有文董志远张瑞杨俊
关键词:ZNO掺杂单晶
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